Showing results: 331 - 345 of 535 items found.
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SPEA S.p.A.
Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 3 devices, in the size of a postcard.
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Micro Control Company
Conforms to SEMI ergonomic standards Holds and transports card cages for semi-automatic loading/unloading. Holds up to 10 burn-in boards. Raises and lowers the burn-in boards for easy loading/unloading of boards into ovens or onto test benches. Cart can be adapted to dock with any Micro Control oven.
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PC104 -
Computer Conversions Corporation
The PC104-DS Series are Low Cost, Dual Channel, PC104 Compliant Digital / Synchro / Resolver Output Cards designed to simulate precision AC Synchro and resolver formatted signals for use in navigation and positioning systems or test sets on both industrial and COTS - military type applications.
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Advanced Power Designs, Inc.
Advanced Power Designs is the first to introduce programmable DC power supplies on dual C-Size VXI card formats. Designed specifically for easy integration into new VXI automatic test systems, these state-of-the-art power supplies are fully compliant with all VXI specifications for direct installation into any standard C-Size VXI card cage. They can even be purchased with LABVIEW, LABWINDOWS, CVI or HPVEE Graphical User Interfaces*, and a fully integrated command and control software program written for the National Instruments MXI I/O. protocol.
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Dragon -
Excalibur Systems, Inc.
Excalibur’s Dragon is an advanced, ruggedized PC104 and PC104+ system in an enclosed, modular casing. The system is appropriate for use in data acquisition, recording nd control for any combination of ARINC-429, MIL-STD-1553, Serial, Discrete or similar types of communication. The modular, stack through design of the PC104/PC104+ platform allows you to build a tailor-made configuration based on Excalibur’s extensive range of boards plus any 3rd party cards of the customer’s choosing. Our engineers will integrate and test all 3rd party cards to the customer’s specification.
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Gardien S.C.A.
Dedicated Testers are often inexpensive due to their low test point requirements, which allow for a reduction in switch cards, especially when compared with a Universal Tester. Ease of setup is accomplished through the utilization of transfer connectors between the fixture and the machine. However, this can contribute to a higher fixture cost than typically seen with a Universal Test Fixture due to the nature of their construction which is labor intensive.
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Astronics Corporation
Connect your PC laptop, desktop and tablet computers to avionics databuses with pocket-sized Ballard USB interfaces. Ease of use, versatility and comprehensive databus functionality have made these rugged adapters the industry favorite for avionics test, analysis and simulation in the lab and in the field. Avionics labs routinely integrate Ballard interface cards and full-featured network appliances into their test setups for powerful and reliable databus connection.
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Yelo Ltd.
A test fixture or test jig is the component containing the bed of nails used for testing the PCB or assembled product. It is powered and controlled by the Yelo Testpoint system which has test cards capable of providing multiple test conditions. This system also controls the probes used in the bed of nails, and relays test information back to the Testpoint system to be analysed.
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HBM, Inc
With 25 MS/s, 100 MS/s or 250 MS/s the high speed input cards are suitable for the acquisition of ultra fast, accurate and high resolution transient signals in high speed mechanical tests or electrical/electronic environments. 14-/15-/16-bit resolution; dynamic resolution increase. available 5/18
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8091 -
ELMA Electronic, Inc.
The PMC-to-PCI Adapter for Test is an active extender that accommodates live insertion of one PCI Mezzanine Card (PMC) for performance analysis and testing in a PCI bus environment.
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AutoSIR2™ -
Gen3 Systems Limited
One AutoSIR chassis can hold between 1 to 16 measurement cards and can monitor up to 256 x 2-point test patterns or 78 x 5-point test patterns, or 32 x 9-point test patterns at selectable intervals from minutes to days. Each channel is current limited (1 M Ω), ensuring that dendrites are preserved for failure analysis. The frequent monitoring capability provides a full picture of the electrochemical reactions taking place on a circuit assembly, and provides early trend analysis enabling tests to be curtailed, thus saving considerable test time and money.
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ELMA Electronic, Inc.
Elma implements quickly and easily scalable, robust 19'' subracks, card cages or rackmount chassis for the use in just about any industry or environment: Industrial automation, test & measurement, transportation, energy, defense, communications and medical. The products of Elma Electronic support standards such as IEC, IEEE or AdvancedTCA.
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TFMC900 -
TEWS Technologies GmbH
The TFMC900 is an FMC (FPGA Mezzanine Card) Mezzanine Module designed to test ANSI/VITA 57.1 FMC Carriers during development or series production. Additionally, it offers the possibility to realise various I/O solutions for connected FMC Carriers. Interconnection of the High Pin Count FMC Connector signals can be verified by JTAG and by functional tests. A loop-back of the 10 multi-gigabit transceiver interfaces allows interconnection checks for the high-speed serial interfaces.
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VC20E Lab -
Celadon
*20 millimeter ceramic probe card*Optimized for DC parametric test, modeling and characterization, and single site WLR*Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor*Effective operating temperature range from -65° to 200° C*Leakage as low as 5fA/V. If you require faster settling time, click here*Can be configured with up to 48 probes
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NEOSEM TECHNOLOGY INC
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies. Up to 64 Blades populated in one test head can test over 2000 DUTs in parallel. Neosem Technology’s high parallel DUT count architecture, combined with low capital cost, provides the absolute lowest HVM cost of test.